2008
Hardback (01 Apr 2008)
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Out of stock
The EMMM-2007 Conference brought together leading experts in electron microscopy and materials modeling from around the world to explore how to synergistically combine atomic scale characterization and modeling to enhance the development of new materials.
| ISBN: | 9780735405196 |
| Publisher: | American Institute of Physics |
| Imprint: | American Institute of Physics |
| Pub date: | 01 Apr 2008 |
| Edition: | 2008 |
| DEWEY: | 620.11299 |
| DEWEY edition: | 22 |
| Language: | English |
| Number of pages: | 300 |
| Weight: | 576g |
| Height: | 234mm |
| Width: | 162mm |
| Spine width: | 20mm |
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