Delivery included to the United States

Electron Energy-Loss Spectroscopy in the Electron Microscope

Electron Energy-Loss Spectroscopy in the Electron Microscope

2nd Edition

Hardback (31 May 1996)

Not available for sale

Out of stock

This service is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

Publisher's Synopsis

Explores several applications of EELS developed over the years. This work includes chapters that explore progress in parallel-recording detectors and image-filtering systems as well as spectral fine structure. It also features computer programs which can perform spectrum deconvolution and compute partial ionization cross-sections.

Book information

ISBN: 9780306452239
Publisher: Plenum
Imprint: Springer
Pub date:
Edition: 2nd Edition
DEWEY: 543.0858
DEWEY edition: 20
Number of pages: 485
Weight: 1930g
Height: 235mm
Width: 155mm
Spine width: 28mm