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Electron-Beam, X-Ray, and Ion-Beam Technology

Electron-Beam, X-Ray, and Ion-Beam Technology Submicrometer Lithographies VII : 2-4 March 1988, Santa Clara, California - Proceedings of SPIE--the International Society for Optical Engineering

Paperback (01 Jan 1988)

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Book information

ISBN: 9780892529582
Publisher: The Society
Imprint: The Society
Pub date:
DEWEY: 621.38173
DEWEY edition: 19
Language: English
Number of pages: 307
Weight: -1g