Practical Skills in Forensic Sc...
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Published 01 Nov 2018
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Electron Beam X-Ray Microanalysis
Book (01 Jan 1981)
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Book information
| ISBN: | 9780442232863 |
| Publisher: | Van Nostrand Reinhold |
| Imprint: | Van Nostrand Reinhold |
| Pub date: | 01 Jan 1981 |
| DEWEY: | 543.081 |
| DEWEY edition: | 18 |
| Number of pages: | 578 |
| Weight: | -1g |
| Height: | 240mm |
| Width: | 160mm |
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