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Electron Beam-Specimen Interactions and Simulation Methods in Microscopy

Electron Beam-Specimen Interactions and Simulation Methods in Microscopy - RMS - Royal Microscopical Society

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Book information

ISBN: 9781118696545
Publisher: Wiley Blackwell
Imprint: Wiley Blackwell
Pub date:
Language: English
Number of pages: 296
Weight: 666g
Height: 250mm
Width: 150mm
Spine width: 15mm