Electron Beam Ion Sources and Traps and Their Applications 8th International Symposium, EBIS/T 2000, Upton, New York, 5-8 November 2000 - AIP Conference Proceedings

International Symposium on Electron Beam Ion Sources and Traps and their Applications, Krsto Prelec

2001

Hardback (02 Aug 2001)

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Publisher's Synopsis

This symposium is a triennial event, held in different places around the world (next symposium will be in Japan, in 2003). The topic of the symposium is the development of electron beam ion sources and traps and their applications, so far in basic science and research, but with prospects for extending them into other areas. Potential readers would have an interest in atomic physics and applications to accelerator physics.

Book information

ISBN:	9780735400115
Publisher:	American Institute of Physics
Imprint:	American Institute of Physics
Pub date:	02 Aug 2001
Edition:	2001
DEWEY:	539.73
DEWEY edition:	21
Language:	English
Number of pages:	304
Weight:	620g
Height:	230mm
Width:	165mm
Spine width:	23mm