Hardback (07 Feb 1994)
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Addresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes with a discussion regarding current status and future plans for electromigration resistant advanced metallization systems for VLSI.
| ISBN: | 9780471584896 |
| Publisher: | Wiley |
| Imprint: | Wiley-Interscience |
| Pub date: | 07 Feb 1994 |
| DEWEY: | 621.3815 |
| DEWEY edition: | 20 |
| Language: | English |
| Number of pages: | 343 |
| Weight: | 680g |
| Height: | 240mm |
| Width: | 160mm |
| Spine width: | 20mm |
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