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Dimensional Optical Metrology and Inspection for Practical Applications IV

Dimensional Optical Metrology and Inspection for Practical Applications IV 20-21 April 2015, Baltimore, Maryland, United States - Proceedings of SPIE

Paperback (30 Sep 2015)

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Publisher's Synopsis

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Book information

ISBN: 9781628416053
Publisher: SPIE
Imprint: SPIE
Pub date:
Language: English
Number of pages: 277
Weight: -1g
Height: 279mm
Width: 216mm