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Dimensional Optical Metrology and Inspection for Practical Applications II

Dimensional Optical Metrology and Inspection for Practical Applications II 25-26 August 2013, San Diego, California, United States - Proceedings of SPIE

Paperback (30 Nov 2013)

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    Publisher's Synopsis

    Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

    Book information

    ISBN: 9780819496898
    Publisher: SPIE
    Imprint: SPIE
    Pub date:
    Number of pages: 277
    Weight: -1g

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