1993
Hardback (31 Aug 1993)
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Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from an inspection mentality to using testing as a step
| ISBN: | 9780442006433 |
| Publisher: | Springer US |
| Imprint: | Springer |
| Pub date: | 31 Aug 1993 |
| Edition: | 1993 |
| DEWEY: | 621.381548 |
| DEWEY edition: | 20 |
| Language: | English |
| Number of pages: | 179 |
| Weight: | 454g |
| Height: | 234mm |
| Width: | 156mm |
| Spine width: | 12mm |
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