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Digital Circuit Testing and Testability

Digital Circuit Testing and Testability

Hardback (20 Jan 1997)

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Publisher's Synopsis

In the past few years, reliable hardware system design has become increasingly important in the computer industry. Digital Circuit Testing and Testability is an easy to use introduction to the practices and techniques in this field. Parag K. Lala writes in a user-friendly and tutorial style, making the book easy to read, even for the newcomer to fault-tolerant system design. Each informative chapter is self-contained, with little or no previous knowledge of a topic assumed. Extensive references follow each chapter, making further research in a particular area readily available. Each chapter covers a different aspect or technological component of fault-tolerant system design, and this book is an excellent compilation of up-to-date information in an area where such a book is needed.

Book information

ISBN: 9780124343306
Publisher: Academic Press
Imprint: Academic Press
Pub date:
DEWEY: 621.3950287
DEWEY edition: 21
Language: English
Number of pages: 199
Weight: 545g
Height: 229mm
Width: 152mm
Spine width: 20mm