Book (31 Dec 1997)
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Papers from the October 1996 workshop concentrate on areas such as IDDQ's effectiveness with emerging submicron and other technologies, testing and testability, limit setting and testing, current sensors, test generation and testing, and future trends. Subjects include automatic test pattern generation for IDDQ faults based on symbolic simulation,
| ISBN: | 9780818676550 |
| Publisher: | IEEE Computer Society Press |
| Imprint: | IEEE Computer Society Press |
| Pub date: | 31 Dec 1997 |
| DEWEY: | 621.39732 |
| DEWEY edition: | 21 |
| Language: | English |
| Number of pages: | 105 |
| Weight: | -1g |
| Height: | 273mm |
| Width: | 222mm |
| Spine width: | 12mm |
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