Biometrics
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Published 20 Nov 2018
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Diffractometry and Scatterometry 24-28 May 1993, Warsaw, Poland - Proceedings / SPIE--the International Society for Optical Engineering
Paperback (01 Jan 1994)
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Book information
| ISBN: | 9780819412409 |
| Publisher: | SPIE |
| Imprint: | SPIE |
| Pub date: | 01 Jan 1994 |
| DEWEY: | 535.4 |
| DEWEY edition: | 20 |
| Language: | English |
| Number of pages: | 268 |
| Weight: | -1g |
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