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Developments in X-Ray Tomography IV

Developments in X-Ray Tomography IV 4-6 August, 2004, Denver, Colorado, USA - SPIE Proceedings Series

Paperback (30 Nov 2004)

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Publisher's Synopsis

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Book information

ISBN: 9780819454737
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 616.0757
DEWEY edition: 22
Language: English
Number of pages: 802
Weight: 1882g
Height: 260mm
Width: 215mm
Spine width: 44mm