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Determining Nanoscale Physical Properties of Materials by Microscopy and Spectroscopy

Determining Nanoscale Physical Properties of Materials by Microscopy and Spectroscopy Symposium Held November 29-December 3, 1993, Boston, Massachusetts, U.S.A - Materials Research Society Symposium Proceedings

Book (01 Jan 1994)

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Publisher's Synopsis

Presents papers from the winter 1993 symposium. Highlights include a demonstration of the near-field scanning optical microscope, and research in X-ray microscopy and chemical contrast producing structural and bulk-imaging from wet synthetic and biological materials. Other topics include developments in scanning probe microscopies, and measurement

Book information

ISBN: 9781558992313
Publisher: Materials Research Society
Imprint: Materials Research Society
Pub date:
DEWEY: 620.112990287
DEWEY edition: 20
Language: English
Number of pages: 622
Weight: 1043g
Height: 241mm
Width: 165mm
Spine width: 38mm