Hardback (30 Dec 2010)
Includes delivery to the United States
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Covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC). This book provides insight into refined ""classical"" design and test topics and solutions for IC test technology and fault-tolerant systems.
| ISBN: | 9781609602123 |
| Publisher: | IGI Global |
| Imprint: | IGI Global |
| Pub date: | 30 Dec 2010 |
| DEWEY: | 621.3815 |
| DEWEY edition: | 22 |
| Language: | English |
| Number of pages: | 550 |
| Weight: | 1610g |
| Height: | 284mm |
| Width: | 218mm |
| Spine width: | 36mm |
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