Publisher's Synopsis
Topics covered in this volume include reliability and degradation of electronic devices, recombination-enhanced motion and related defects, defects in epitaxial layers and reliability and degradation of metal III-V systems.
About the Publisher
Cambridge University Press dates from 1534 and is part of the University of Cambridge. We further the University's mission by disseminating knowledge in the pursuit of education, learning and research at the highest international levels of excellence.
