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Defects and Synchrotron X-Ray Topography in Silicone-Carbide Based Devices

Defects and Synchrotron X-Ray Topography in Silicone-Carbide Based Devices - Defect and Diffusion Forum

Paperback (06 Jul 2023)

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Publisher's Synopsis

The presented special edition is devoted to the latest research in semiconductor materials and devices on silicon carbide and the design and research of machines and equipment. This issue will be helpful to specialists engaged in the design and production of power electronics and to mechanical engineers.

Book information

ISBN: 9783036403328
Publisher: Trans Tech Publications Ltd
Imprint: Trans Tech Publications
Pub date:
Language: English
Number of pages: 152
Weight: -1g
Height: 240mm
Width: 170mm
Spine width: 8mm