Hardback (31 Jan 1993)
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Nearly three dozen papers from the November 1992 conference in Dallas, Texas, discuss methods of testing the large circuits used in microelectronics. The sections cover defect and yield modeling, fault tolerant arrays and systems, testing, concurrent error detection, system fault diagnosis, defect and fault modeling, defect tolerance, fault toleran
| ISBN: | 9780818628351 |
| Publisher: | IEEE Computer Society Press,U.S. |
| Imprint: | IEEE Computer Society Press,U.S. |
| Pub date: | 31 Jan 1993 |
| DEWEY: | 621.395 |
| Language: | English |
| Number of pages: | 352 |
| Weight: | -1g |
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