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Defect and Fault Tolerance in VLSI Systems. IEEE International Symposium (DFT)

Defect and Fault Tolerance in VLSI Systems. IEEE International Symposium (DFT)

Paperback (30 Nov 1997)

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Publisher's Synopsis

Papers from the 1997 IEEE International Symposium on Defect and Fault Tolerant in VLSI Systems.

Book information

ISBN: 9780818681684
Publisher: IEEE Computer Society Press,U.S.
Imprint: IEEE Computer Society Press,U.S.
Pub date:
DEWEY: 621.395
Language: English
Number of pages: 350
Weight: -1g
Height: 222mm
Width: 152mm
Spine width: 12mm