Hardback (30 May 1996)
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These proceedings provide an overview of research into defect inhomogeneities semiconductor materials and (as grown) devices.
Defect inhomogeneities affect the performance of both as grown and processed semiconductors. A valuable overview of mapping and microscopy techniques for the study of such defects and an insight into the effect of such defects on device performance.
| ISBN: | 9780750303729 |
| Publisher: | Taylor and Francis |
| Imprint: | CRC Press |
| Pub date: | 30 May 1996 |
| DEWEY: | 621.38152 |
| DEWEY edition: | 20 |
| Language: | English |
| Number of pages: | 369 |
| Weight: | -1g |
| Height: | 234mm |
| Width: | 156mm |
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