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DFT 2007

DFT 2007 22nd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : Proceedings : 26-28 September, 2007, Rome, Italy

Book (01 Jan 2007)

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Book information

ISBN: 9780769528854
Publisher: IEEE Computer Society Press
Imprint: IEEE Computer Society Press
Pub date:
DEWEY: 621.395
DEWEY edition: 22
Language: English
Number of pages: 537
Weight: -1g