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Characterisation of Crystal Growth Defects by X-Ray Methods

Characterisation of Crystal Growth Defects by X-Ray Methods - NATO Advanced Study Institutes Series.

Hardback (01 Jan 1981)

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Book information

ISBN: 9780306406287
Publisher: Springer
Imprint: Plenum published in cooperation with NATO Scientific Affairs Division
Pub date:
DEWEY: 548.83
DEWEY edition: 18
Language: English
Number of pages: 589
Weight: 1g