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Beam Injection Assessment of Microstructures in Semiconductors

Beam Injection Assessment of Microstructures in Semiconductors - Solid State Phenomena

Paperback (15 Apr 2001) | German

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Publisher's Synopsis

The characterisation of semiconductors is of key importance in preparing and applying semiconductors in industry. Volume is indexed by Thomson Reuters CPCI-S (WoS).The present work deals with theoretical and experimental topics which are related to the assessment of microstructures in semiconductors by means of beam injection and related methods.

Book information

ISBN: 9783908450610
Publisher: Trans Tech Publications Ltd
Imprint: Trans Tech Publications
Pub date:
Language: German
Number of pages: 522
Weight: 793g
Height: 245mm
Width: 172mm
Spine width: 25mm