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Atom Probe Field Ion Microscopy

Atom Probe Field Ion Microscopy - Monographs on the Physics and Chemistry of Materials

Hardback (19 Sep 1996)

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Publisher's Synopsis

This book provides a definitive account of the theory, practice and applications of atom probe field ion microscopy (APFIM). The APFIM technique provides a unique method for observing and chemically identifying single atoms on solid surfaces. Recent advances in the method,which are largely due to the present authors, now permit the atomic-scale chemistry of a solid specimen to be recognised in three dimensions. As a result of these developments, new and exciting applications are rapidly emerging in the field of material science, surface science, and catalysis. The book is a state-of-the art account of this important field, and is intended for a graduate-level readership.

About the Publisher

Oxford University Press

Oxford University Press is a department of the University of Oxford. It furthers the University's objective of excellence in research, scholarship, and education by publishing worldwide. Our products cover an extremely broad academic and educational spectrum, and we aim to make our content available to our users in whichever format suits them best.We publish for all audiences-from pre-school to secondary level schoolchildren; students to academics; general readers to researchers; individuals to institutions. Our range includes dictionaries, English language teaching materials, children's books, journals, scholarly monographs, printed music, higher education textbooks, and schoolbooks.

Book information

ISBN: 9780198513872
Publisher: OUP OXFORD
Imprint: Oxford University Press
Pub date:
DEWEY: 502.82
DEWEY edition: 20
Language: English
Number of pages: 509
Weight: 1042g
Height: 242mm
Width: 164mm
Spine width: 33mm