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Atom-Probe Field Ion Microscopy and Its Applications

Atom-Probe Field Ion Microscopy and Its Applications - Advances in Electronics and Electron Physics.

Book (21 Jun 1989)

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Book information

ISBN: 9780120145829
Publisher: Academic Press
Imprint: Academic Press
Pub date:
DEWEY: 502.82
DEWEY edition: 20
Number of pages: 299
Weight: -1g