Paperback (31 Jan 1999)
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This collection of papers was presented at the Seventh Asian Test Symposium. It covers topics such as: BIST; high-level synthesis; delay testing; fault modelling and simulation; software testing; current testing; test engineering; sequential circuit testing; and defect analysis and fault diagnosis.
| ISBN: | 9780818682773 |
| Publisher: | IEEE Computer Society Press,U.S. |
| Imprint: | IEEE Computer Society Press,U.S. |
| Pub date: | 31 Jan 1999 |
| DEWEY: | 004.24 |
| Language: | English |
| Number of pages: | 300 |
| Weight: | -1g |
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