Paperback (31 Jan 1998)
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Areas covered in this text include: test generation; design for testability; fault tolerance; case studies for DFT techniques in Japanese industry; test technologies; beam testing of VLSI circuits in Japan; mixed-signal test; novel beam testing techniques in Japan; and current testing.
| ISBN: | 9780818682094 |
| Publisher: | IEEE Computer Society Press,U.S. |
| Imprint: | IEEE Computer Society Press,U.S. |
| Pub date: | 31 Jan 1998 |
| DEWEY: | 004.24 |
| Language: | English |
| Number of pages: | 400 |
| Weight: | -1g |
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