Paperback (31 Oct 1996)
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The November 1994 symposium heard 62 papers on subjects related to testing and design for electronic devices, assemblies, and systems more specifically: fault simulation, on-line testing, test pattern generation and parallel testing, diagnostics, supply current testing, fault modeling, design for testability, built-in self test, and test cost reduc
| ISBN: | 9780818666902 |
| Publisher: | IEEE Computer Society Press,U.S. |
| Imprint: | IEEE Computer Society Press,U.S. |
| Pub date: | 31 Oct 1996 |
| DEWEY: | 004.24 |
| Language: | English |
| Number of pages: | 206 |
| Weight: | -1g |
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