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Asian Test Symposium Proceedings. 2nd

Asian Test Symposium Proceedings. 2nd

Paperback (30 Apr 1994)

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    Publisher's Synopsis

    Proceedings of the 2nd Asian Test Symposium held in Beijing, China, in November 1993. Among the topics: fault tolerance, analog and mixed circuit testing, and testability analysis. No index. Annotation copyright Book News, Inc. Portland, Or.

    Book information

    ISBN: 9780818639302
    Publisher: IEEE Computer Society Press,U.S.
    Imprint: IEEE Computer Society Press,U.S.
    Pub date:
    DEWEY: 004.24
    Language: English
    Number of pages: 274
    Weight: -1g
    Height: 273mm
    Width: 215mm
    Spine width: 19mm

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