Paperback (28 Feb 1993)
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Seventy-three contributors from 12 countries in Asia, Europe, and North America demonstrate a strong interest in the field of test and design technologies. Discussions include fault simulation, one-line testing, diagnostics, and testability techniques. The symposium was held in Hiroshima, Japan, November 1992. No index. Annotation copyright Book Ne
| ISBN: | 9780818629853 |
| Publisher: | IEEE Computer Society Press,U.S. |
| Imprint: | IEEE Computer Society Press,U.S. |
| Pub date: | 28 Feb 1993 |
| DEWEY: | 621.381 |
| Language: | English |
| Number of pages: | 272 |
| Weight: | -1g |
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