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Applied Scanning Probe Methods XI

Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques - Nanoscience and Technology

2009

Hardback (04 Nov 2008)

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Publisher's Synopsis

'Applied Scanning Probe Methods' examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span many topographic and dynamical surface studies.

Book information

ISBN: 9783540850366
Publisher: Springer Berlin Heidelberg
Imprint: Springer
Pub date:
Edition: 2009
DEWEY: 502.82
DEWEY edition: 22
Language: English
Number of pages: 460
Weight: 526g
Height: 243mm
Width: 163mm
Spine width: 16mm