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Applied Scanning Probe Methods IV

Applied Scanning Probe Methods IV Industrial Application - Nanoscience and Technology

2006

Hardback (22 Feb 2006)

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Publisher's Synopsis

'Applied Scanning Probe Methods' examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span many topographic and dynamical surface studies.

Book information

ISBN: 9783540269120
Publisher: Springer Berlin Heidelberg
Imprint: Springer
Pub date:
Edition: 2006
DEWEY: 502.82
DEWEY edition: 22
Language: English
Number of pages: 200
Weight: 576g
Height: 235mm
Width: 155mm
Spine width: 17mm