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Applications of X-Ray Topographic Methods to Materials Science

Applications of X-Ray Topographic Methods to Materials Science

Hardback (01 Dec 1984)

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Book information

ISBN: 9780306418389
Publisher: Springer US
Imprint: Springer
Pub date:
DEWEY: 620.11272
DEWEY edition: 19
Language: English
Number of pages: 536
Weight: 1140g