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Applications and Metrology at Nanometer-Scale. 2 Measurement Systems, Quantum Engineering and RBDO Method

Applications and Metrology at Nanometer-Scale. 2 Measurement Systems, Quantum Engineering and RBDO Method

Hardback (07 May 2021)

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Publisher's Synopsis

Book information

ISBN: 9781786306876
Publisher: Wiley
Imprint: Wiley-ISTE
Pub date:
DEWEY: 620.115
DEWEY edition: 23
Language: English
Number of pages: 288
Weight: 454g
Height: 10mm
Width: 10mm
Spine width: 10mm