Publisher's Synopsis
This work addresses various Open Systems Interconnection (OSI) Physical (PHY) layer mechanisms to extract and exploit RF waveform features ("fingerprints") that are inherently unique to specific devices and that may be used to provide hardware specific identification(manufacturer, model, and/or serial number). This is addressed by applying a Dual-Tree Complex Wavelet Transform (DT-CWT) to improve burst detection and RF fingerprint classification. A "Denoised VT" technique is introduced to improve performance at lower SNRs, with denoising implemented using a DT-CWT decomposition prior to Traditional VT processing. A newly developed Wavelet Domain (WD) fingerprinting technique is presented using statistical WD fingerprints with Multiple Discriminant Analysis/Maximum Likelihood (MDA/ML) classification.
