Publisher's Synopsis
The composition of a surface is of critical importance in determining the way in which a material will interact with its environment. Surface analysis - the analysis of the outer few nanometres of a material - has now become a routine undertaking in many laboratories throughout the world, and is of great importance in research into such areas as corrosion, adhesion, polymer surface treatment, and microelectronics fabrication.;This book considers the two most popular surface analysis techniques: X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES). It explains the underlying physical principles, discusses the instrumentation employed and looks at the interpretation of the resulting spectra. Applications of XPS and AES in materials of science are considered, and the final chapter provides a critical comparison of XPS and AES with other surface analytical techniques.;This handbook will provide a useful introduction to the use of electron spectroscopy for surface analysis for students and researchers in physics, engineering, and materials science.
