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Advances in Surface and Thin Film Diffraction

Advances in Surface and Thin Film Diffraction Symposium Held November 27-29, 1990, Boston, Massachusetts, U.S.A - Materials Research Society Symposium Proceedings

Hardback (26 Apr 1991)

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Publisher's Synopsis

These proceedings of the symposium at the November 1990 MRS Meeting in Boston highlight recent advances in x-ray, electron, and atom diffraction techniques as well as studies of surfaces, adsorption and phase transformations, epitaxial, superlattices and strained layers, and thin films and buried in

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Cambridge University Press

Cambridge University Press dates from 1534 and is part of the University of Cambridge. We further the University's mission by disseminating knowledge in the pursuit of education, learning and research at the highest international levels of excellence.

Book information

ISBN: 9781558991002
Publisher: Materials Research Society
Imprint: Cambridge University Press
Pub date:
DEWEY: 620.44
DEWEY edition: 20
Language: English
Number of pages: 367
Weight: 1000g
Height: 230mm
Width: 152mm
Spine width: 33mm