Biometrics
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Published 20 Nov 2018
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Advances in Resist Technology and Processing XVIII 26-28 February, 2001, Santa Clara, [California] USA - SPIE Proceedings Series
Paperback (24 Aug 2001)
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Book information
| ISBN: | 9780819440310 |
| Publisher: | SPIE |
| Imprint: | SPIE |
| Pub date: | 24 Aug 2001 |
| DEWEY: | 621.381531 |
| DEWEY edition: | 21 |
| Language: | English |
| Number of pages: | 1084 |
| Weight: | 1352g |
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