Paperback (12 Sep 2011)
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Volume is indexed by Thomson Reuters CPCI-S (WoS).This second collection on "Advanced Measurement and Test II" is dedicated to the electronic testing of devices, boards and systems; covering the complete cycle from design verification, design-for-testing, design-for-manufacturing, silicon de-bugging, manufacturing testing, system testing, diagnosis, failure analysis ... and back to process and design improvement. This will be an invaluable guide to the topics.
| ISBN: | 9783037851975 |
| Publisher: | Trans Tech Publications Ltd |
| Imprint: | Trans Tech Publications |
| Pub date: | 12 Sep 2011 |
| Language: | English |
| Number of pages: | 2898 |
| Weight: | 3288g |
| Height: | 241mm |
| Width: | 165mm |
| Spine width: | 101mm |
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