Publisher's Synopsis
Quantitative methods and measuring techniques based on optics are at present developing rapidly and are becoming instrumental in further advances in light microscopy. Volume 3 of Advanced Light Microscopy is fully devoted to microscopical metrology, with special emphasis on micrometry, stereology, microphotometry, microfluorometry, flow cytometry, metrology in polarized light, microinterferometry, optical diffractometry, and automatic analysis of microscopical images. A brief description of laser Doppler microvelocimetry is also given. However, the highlight of Volume 3 is the chapter on microinterferometry, which is the author's major expertise. In particular, new microinterferometric techniques, referred to as variable wavelength interferometry (VAWI) and object-adapted VAWI methods, are for the first time included in a book edition.
