Delivery included to the United States

Acoustic Scanning Probe Microscopy

Acoustic Scanning Probe Microscopy - Nanoscience and Technology

2013

Hardback (04 Oct 2012)

  • $151.08
Add to basket

Includes delivery to the United States

10+ copies available online - Usually dispatched within 7 days

Other formats & editions

New
Paperback (09 Nov 2014) - 2013 $143.54

Publisher's Synopsis

The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive review of different scanning probe acoustic techniques, including AFAM, UAFM, SNFUH, UFM, SMM and torsional tapping modes. Basic theoretical explanations are given to understand not only the probe dynamics but also the dynamics of tip surface contacts. Calibration and enhancement are discussed to better define the performance of the techniques, which are also compared with other classical techniques such as nanoindentation or surface acoustic wave. Different application fields are described, including biological surfaces, polymers and thin films.

Book information

ISBN: 9783642274930
Publisher: Springer Berlin Heidelberg
Imprint: Springer
Pub date:
Edition: 2013
DEWEY: 620.1127
DEWEY edition: 23
Language: English
Number of pages: 320
Weight: 8985g
Height: 235mm
Width: 155mm
Spine width: 30mm