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Material collected here was presented at an October 2003 symposium. Some subjects discussed are worst-case to average-case reductions for NP problems, algorithms and complexity results for #SAT and Bayesian inference, logics for reasoning about cryptographic constructions, and the cost of cache-oblivious searching. Locally testable cyclic codes, as
| ISBN: | 9780769520407 |
| Publisher: | IEEE,. |
| Imprint: | IEEE,. |
| Language: | English |
| Number of pages: | 661 p. |
| Weight: | -1g |
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