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2nd European Congress on Optics Applied to Metrology (METROP)

2nd European Congress on Optics Applied to Metrology (METROP) Presented as Part of the Optics, Photonics, and Iconics Engineering Meeting (OPIEM), November 26-30, 1979, Strasbourg, France - Proceedings of the Society of Photo-Optical Instrumentation Engineers ; V. 210

Book (01 Jan 1980)

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Book information

ISBN: 9780892522385
Publisher: Society of Photo-optical Instrumentation Engineers
Imprint: Society of Photo-optical Instrumentation Engineers
Pub date:
DEWEY: 620.0044
DEWEY edition: 19
Language: English
Number of pages: 228