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21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems Proceedings : Arlington, Virginia, USA, October 4-6, 2006

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Book information

ISBN: 9780769527062
Publisher: IEEE Computer Society Press
Imprint: IEEE Computer Society Press
Pub date:
DEWEY: 621.395
DEWEY edition: 22
Language: English
Number of pages: 583
Weight: -1g