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2010 25th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : DFT 2010

2010 25th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : DFT 2010 Proceedings, 6-8 October 2010, Kyoto, Japan

Paperback (01 Jan 2010)

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Book information

ISBN: 9780769542430
Publisher: IEEE Computer Society Press
Imprint: IEEE Computer Society Press
Pub date:
Language: English
Number of pages: 449