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2009 27th IEEE VLSI Test Symposium

2009 27th IEEE VLSI Test Symposium Proceedings : 3-7 May 2009 Santa Cruz, CA, USA ; VTS 2009

Book (01 Jan 2009)

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Book information

ISBN: 9780769535982
Publisher: IEEE Computer Society
Imprint: IEEE Computer Society
Pub date:
DEWEY: 621.395
DEWEY edition: 22
Language: English
Number of pages: 341