Delivery included to the United States

2007 IEEE International Test Conference, Santa Clara, CA, 21-26 October 2007.

2007 IEEE International Test Conference, Santa Clara, CA, 21-26 October 2007.

Paperback

Not available for sale

Out of stock

This service is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

Book information

ISBN: 9781424411276
Publisher: IEEE Service Ctr/Curran Assocs Inc
Number of pages: ca. 1060 p
Weight: -1g