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2007 IEEE International Conference on Computational Intelligence for Measurement Systems and Applications

2007 IEEE International Conference on Computational Intelligence for Measurement Systems and Applications 27-29 June 2007, Ostuni, Italy)

Hardback (01 Jan 2006)

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Book information

ISBN: 9781424408238
Publisher: IEEE
Imprint: IEEE
Pub date:
DEWEY: 006.3
DEWEY edition: 22
Language: English
Weight: -1g