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2006 IEEE International Workshop on Memory Technology, Design, and Testing

2006 IEEE International Workshop on Memory Technology, Design, and Testing 2-4 August 2006, Taipei, Taiwan : Proceedings

Paperback (01 Jan 2006)

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Book information

ISBN: 9780769525723
Publisher: IEEE Computer Society
Imprint: IEEE Computer Society
Pub date:
DEWEY: 621.39732
DEWEY edition: 22
Language: English
Number of pages: 83
Weight: -1g